- SOLAR has introduced various precision analytical instruments, trained professional technicians, established an international-standard material analysis laboratory, and built a professional precious metal analysis laboratory. Meanwhile. By managing analysis and data quality with Laboratory Information Management System (LIMS), SOLAR provides chemical property analysis, physical property analysis services to customers.
- SOLAR’s laboratory aims to provide accurate and effective analytical services. In order to provide best-in-class services, we seek continuous improvement in analysis technology and quality management system, and also passed domestic and international lab certifications. Additionally, we regularly participate in the analysis ability test programs organized by international institutions.

Services
Analytical Instrument | Application |
---|---|
Glow Discharge Mass Spectrometer (GDMS) | Impurity analysis of high-purity materials |
Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES) | Content detection of major and trace elements in solid, powder and liquid |
Inductively Coupled Plasma-Mass Spectrometry (ICP-MS) | Trace Impurity analysis |
Spark-Optical Emission Spectroscopy (Spark OES) | Trace elements analysis in solid precious metal samples |
X-Ray Fluorescence (XRF) | Non-destructive X-ray fluorescence detection |
Carbon/ Sulfur Analyzer | Detection of trace carbon (C) and sulfur (S) in materials |
Nitrogen/ Oxygen/Hydrogen Analyzer | Detection of trace nitrogen (N), oxygen (O) and hydrogen (H) in materials |
Ion Chromatography (IC) | Detection of trace anion and cation |
Fire Assay | Noble metal elements analysis of solid waste samples (such as electronic scrap, precious metal catalysts, etc.) |
Automatic Titrator | Noble metal elements analysis of waste liquid samples containing precious metals |
Scanning Electron Microscope(SEM) | Metallographic and microstructure observation |
Energy-dispersive X-ray Spectroscopy(EDX) | Non-destructive qualitative compositional analysis in SEM |
Electron Backscatter Diffraction(EBSD) | Analysis of sample’s crystallographic properties |
3D Optical Microscope | Micronscale surface roughness and surface topography observation |
Surface Scanner | Nanoscale surface roughness and morphology observation (non-contact laser with white light scanning) |
Coordinate Measuring Machine (CMM) | Multi-class size and large area (~800mm) contact type measurement |
Surface Roughness and Contour Measuring Instrument | Thickness and contour measurement by contact inner diameter and angle |
X-ray Diffraction (XRD) | Non-destructive analysis technology for crystal structure, preferred crystal orientation, crystallization phases and other structural parameters |
Surface Area Analysis (BET) | Specific surface area detection |
Power Spectral Density (PSD) | Powder particle size detection |
Hardness Testing | Material hardness testing |
Universal Testing Machine | Bending strength and tensile force testing |
Ultrasonic Inspector | Non-destructive internal defects inspection |